概要In RF testing the path between the test system and the unit under test (UUT) can present several problems which impact test cost including expensive and long SiO2 cables; long test times, during which the RF characteristics of the paths may change, invalidating all are part of the test, and UUT in a thermal/vacuum environment as well as others.
Keysight Technologies, Inc., in cooperation with our partner COM DEV Ltd., is offering an in situ calibration correction verification solution.
The correction data can be used to significantly improve the accuracy of the S-parameter measurements without the need to disconnect test cables or interrupt the test for frequent re-calibration.
■主な特長と仕様
・Small package size
・Low insertion loss
・Complete system solution (hardware and software)
・Offered as part of a switch matrix or a complete system solution
・Wide frequency range
・Thermal/vacuum capable
・NIST traceable when used with Keysight eCal module for initial calibration